INTERNATIONAL JOURNAL OF NOVEL RESEARCH AND DEVELOPMENT International Peer Reviewed & Refereed Journals, Open Access Journal ISSN Approved Journal No: 2456-4184 | Impact factor: 8.76 | ESTD Year: 2016
Scholarly open access journals, Peer-reviewed, and Refereed Journals, Impact factor 8.76 (Calculate by google scholar and Semantic Scholar | AI-Powered Research Tool) , Multidisciplinary, Monthly, Indexing in all major database & Metadata, Citation Generator, Digital Object Identifier(DOI)
Wafer defect detection is an important step in the semiconductor manufacturing process
because it ensures the final product’s quality and reliability. Traditional wafer defect detection methods can be slow and error-prone, and they may be incapable of detecting small or complex defects.
Machine learning algorithms such as convolutional neural networks (CNNs) have been used to detect
wafer defects with promising results in recent years. YOLO (You Only Look Once), a popular object
detection algorithm based on CNNs, is one such algorithm. YOLO has gone through several iterations,
including YOLOv1, YOLOv2, YOLOv3, YOLOv4 and, YOLOv5 are most recent one. The YOLOv5
algorithm is the most recent version and powerful, and it includes several improvements over previous
versions, such as a new object detector and a more efficient network architecture. In this research, we
use YOLO v5 to detect wafer defects and evaluate its performance on a wafer image dataset. In this
paper, we compare the accuracy of different YOLOv5 models. Our results show that YOLOv5x can
detect wafer defects with high accuracy and speed, outperforming traditional wafer defect detection
methods.
Keywords:
YOLO, RECALL, PRECESION, CNN
Cite Article:
"Semiconductor Wafer Defects Detection using Yolov5 Model", International Journal of Novel Research and Development (www.ijnrd.org), ISSN:2456-4184, Vol.8, Issue 10, page no.b601-b606, October-2023, Available :http://www.ijnrd.org/papers/IJNRD2310164.pdf
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ISSN:
2456-4184 | IMPACT FACTOR: 8.76 Calculated By Google Scholar| ESTD YEAR: 2016
An International Scholarly Open Access Journal, Peer-Reviewed, Refereed Journal Impact Factor 8.76 Calculate by Google Scholar and Semantic Scholar | AI-Powered Research Tool, Multidisciplinary, Monthly, Multilanguage Journal Indexing in All Major Database & Metadata, Citation Generator
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